Single event phenomena
Electronic designers including those involved in spacecraft, missle, and aircraft avionics and ground systems will welcome a comprehensive treatment of SEU. This book will be used to achieve hardened designs necessary to mitigate the effects of SEU. Since SEU is a growing problem as future chip transitor densities are ever-increasing, this volume will be an invaluable … celý popis
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- Typ dokumentu
- Knihy
- Fyzický popis
- xvii, 351 s. : il.
- Vydáno
-
New York,N.Y, :
Chapman and Hall,
1997
- Témata
- Bibliografie
- 0bsahuje bibliografie a rejstřík
- ISBN
- 0-412-09731-1 (váz.)
